Enter Group Quadra - High Throughput Scanning Probe Microscopy

Nearfield Instruments introduces breakthrough technology with their High-Throughput Scanning Probe Microscopy metrology equipment, utilizing four patented high-speed miniaturized Atomic Force Microscopes in parallel in a single metrology tool. We developed this High Tech 3D visualisation.

Skills
3D / Animation / Film / VFX
Sectors
High-tech / Innovation
Client
Enter Group
Status
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